Research articles
ScienceAsia 38(2012): 182-187 |doi:
10.2306/scienceasia1513-1874.2012.38.182
Accurate determination of the low-angle structure factors of βNiAl by powder X-ray diffraction
Alan˙G.˙Foxa,*, E.˙Sarath˙K.˙Menonb
ABSTRACT: An improved approach to the analysis of powder X-ray diffractometer data obtained from crystalline materials has been developed and applied to diffraction data obtained from powdered βNi-50.51 at% Al (B2 cubic structure) with Cu-Kα radiation. Great care was taken to ensure the accuracy of the alloy chemical analysis and very fine powders (less than 5˙{µm} particle size) were used to minimize the effects of preferred orientation and extinction. As a result it was found that, even when only a few reflections are available for study and anomalous dispersion corrections and thus extinction corrections are somewhat larger than normal due to excessive fluorescence, it is possible to obtain accurate low-angle structure factor values that give information about crystal bonding. In the case of βNiAl, this appears to be predominantly ionic. These results mean that any laboratory that has a basic powder X-ray diffractometer can adopt this approach and make accurate measurements of the structure factors of many crystalline solids.
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| a |
Faculty˙of˙Engineering˙and˙Technology, Asian˙University, 89˙Moo˙12, Highway˙331, Banglamung, Chon˙Buri˙20150˙Thailand |
| b |
Centre˙for˙Materials˙Science˙and˙Engineering, Department˙of˙Mechanical˙and˙Astronautical˙Engineering, Naval˙Postgraduate˙School, Monterey, CA˙93943, USA |
* Corresponding author, E-mail: afox@asianust.ac.th
Received 3 Nov 2011, Accepted 11 Apr 2012
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